Automatic Optical Inspection System

VL1000 V series

Key Features 

Dual magazine loading system.

Dual indexing XY stage for high throughput.

On-the-fly scanning megapixel camera inspection systems.

GUI and Recipe Management for quick-setup. 

SEMI E142 or XML text format interface strip mapping communication platform. 

Defect classification included lead punch, wire break mechanism and ink-marking.

SECS/GEM or TCP/IP via host communication platform.

DEFECT DETECTS –

Wires: missing, damaged, off pad, club foot

Die: missing, wrong, chipped, cracked, contamination

Part: position, missing, wrong, polarity, skew, tombstone

Epoxy: contamination, insufficient, excessive, bridging

Solder: contamination, insufficient, excessive, bridging