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YXLON Cheetah EVO Series
Product Description

YXLON Cheetah EVO Series

Best-in-class scalable X-ray inspection systems for assembly and laboratory applications.

The YXLON Cheetah EVO series was designed to provide the "best-in-class" inspection solution for SMT, semiconductor, and laboratory assembly applications. With optimized software and hardware, these systems produce higher quality and more consistent results than other electronics inspection systems currently on the market.

  • Exceptional 2D/3D image quality in the shortest time 
  • User-friendly operation for high-tech inspections
  • One-click solutions for advanced manipulations
  • Best-in-class DR technology



Why compromise?

Get the right system for your application.

The Cheetah EVO range was created to achieve a simple goal: the very best image in the shortest time, in each of the electronics market sectors. With 3 different systems, each custom built for either SMT, semiconductor, or laboratory, users get the best solution for their specific and demanding application.


Prepare your Smart Factory with YXLON ProLoop

  • The optimal yield enhancement solution
  • Real-time communication and reporting of failures and trends
  • Continuous process improvement made easy by real-time data integration
  • The ultimate verification process optimizer


Get the right system for demanding semiconductor inspections without compromise

       The Cheetah EVO range of X-ray inspection solutions was created to achieve a simple goal: the very best image in the shortest time, in each of the market sectors. The result is sheer visual brilliance. Cheetah EVO systems harness the combined power of several YXLON innovations – FeinFocus X-ray tube technology; high-power target technology; a finely calibrated, long-life flat-panel detector and a state of the art manipulation system. The systems can.

       In addition to imaging excellence, with Cheetah EVO you can look forward to simple, user-friendly controls and intuitive FGUI – Feinfocus Graphical User Interface – software. Not to mention the myriad of benefits of comprehensive automation. One-click solutions make manual inspection effortless and live SMART filters ensure perfect images.

       Easy Teach-In makes it simple to program complex automated routines that guide you swiftly through inspection steps and deliver repeatable,reliable results and automated reports.

 

Applications

  • Wafer inspection
  • 3D integrated circuit joints
  • Microbumps
  • Sensors
  • MEMS and MOEMS
  • TSV’s


Key benefits for semiconductors

  • Accurate, repeatable void compilations including multi-area voiding
  • Excellent resolution at low power and low kV
  • Fast, automated, easy routines
  • Very fast live (on the fly) inspections

 

 

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