A large travel, high accuracy dimensional metrology system

The VIEW Benchmark 250 delivers the high performance and reliability you expect from VIEW Micro-Metrology in a compact, benchtop package. Its advanced optics, illumination, available through-the-lens laser, and image processing capabilities make it a world-class metrology system. Benchmark 250 is equally at home in the QA lab performing first article inspection or on the production floor providing precision measurements for process control.

   

   Featuring:：

   300 x 150 x 150 mm measuring range
   25 kg (55 lbs) maximum load
   Sub-micron scale resolution
   Stage Drive Velocity X-Y: 150 mm/sec; Z: 100 mm/sec
   Stage Error Mapping: Non-linear 2D error corrections in X-Y plane
   High-precision dual magnification optical system
   Optional Programmable Multi-Color Ring Light (PRL)
   Optional through-the-lens (TTL) laser with autofocus and scanning capabilities
   Advanced image processing for high speed, accuracy and robustness
   Dual, digital, 1.4 megapixel monochrome cameras; 4:1 ratio
   Subpixel accuracy of 1/10 to 1/50 pixel
   Choice of powerful metrology software and data analysis tools
   MTBF ≥ 8,000 hours

   Applications for Benchmark include：
     . Semiconductor/Electronics
   BGA, μBGA, CSP, flip-chip, MCM, bump-on-die
   Lead frames, wire bonds, flex circuits, connectors
   SMT component placement
   Solder paste/Epoxy glue dot
   Chip carriers and trays
   Inkjet printer cartridges
   Fiber optic components and MEMs  
    . Data Storage
   Suspensions
   Slider and Head Gimble Assemblies (HGA)

   Disk media substrates   

    . Precision plastic molded and machined parts

   Dies and tooling
   Medical devices
   Fuel injection components
   Watch components