VS100 Post-Bonded Visual Inspection System (Bench-Top)
designed for strip map data management /environment
Benefits
- Post-bonded inspection with strip map / data management included download, inspect, edit, and upload via host server.
- Programmable indexing motorized stage to handle HD lead frame / substrate size up to 310mm x 110mm L x W.
- Bench-top and compact in size to suit to today agile working environment in IC’s assembly and packaging semiconductor industrials.
- Seamless integrated with Olympus stereo microscope systems.
- Strip map communication platform with SEMI G81 and E142 also available.
- Strip map as key to defect traceability
- Bench-top with compact in size for today agile working environment.
- Motorized stage for HD leadframe / substrate
Inspection, but a key to single device traceability. For the next level of inkless production, IC’s are getting more and more complex, high density, denser, smaller and quality critical with one little lack.
While given you microscopic inspection view, that’s why VS100 strip mapping comes into play and applies a virtual map like representation of physical world to a lot of common leadframe or substrate in strip form.
VS100 is designed to handle with HD motorized stage and programmable to different patterns in indexing to cater and match with HD leadframe or substrate requirement nowadays.
2D dot matrix system for strip ID verification and communicate with host computer for its map / data tracking destination.
VISUAL INSPECTION -
Stereo Microscope (Olympus Japan)
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